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Extremely long lifetime and high resolution of CNT probes versus regular silicon probes 

Regular probes 

普通探针磨损2纳米后,尖端直径就会增大一倍以上!

Regular silicon probes degrade immediately during scanning,

radius of curvature of apex doubled after 2nm height wore out. 

  

 

 

CNT probes 

而碳纳米管探针尖端300-500纳米长,在全部磨掉前分辨率都是一致的,高分辨的。

Length of CNT at the apex of silicon probe: 300-500nm.  

  

 

  

 

  


                                                   

磨损数月后分辨率依然很高。

CNT shortened a little bit after months scanning,

still maintain high and consistent resolution as new.

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