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CNT AFM probes 

CNT probes from us include two series: high resolution and high aspect ratio applications.

       Tip features:

• A carbon nanotube/nanocone of 2 nm radius of curvature right at the apex of regular silicon probe, either tapping or contact mode.

• Probe with perfect alignment,orientation of CNT is better than ±5º.

• Tightly controlled CNT length, 0.6µm±200nm, 1.5µm±200nm, 5µm±500nm.

• Very high resolution (2nm ROC versus 10nm ROC of regular probe).

• Long lifetime (Months versus hours of regular probe).

• CNT probes are in stock and ready to ship with highly competitive price.

Nanowire AFM probe

A single silver alloy nanowire grown at the tip：

        Perfect electric conductivity (< 50 ohm on Platinum substrate)

        Highly wear resistance for extremely long lifetime, high consistance.

    High aspect ratio

Super sharp probes

 tip radius of curvature（3nm), high aspect ratio

Four-tip AFM probe

One holder，four tips with various force contant.

All diamond probes

Both the tip and cantilever are in a single monolithic structure. These are not diamond-coated probes; the cantilever and probe tip are entirely made of diamond and demonstrate the astonishing control and precision that is available with diamond today.